Wojskowa Akademia Techniczna - Centralny System Uwierzytelniania
Strona główna

Micro and Nano Detection

Informacje ogólne

Kod przedmiotu: IOEVXCSM-MNDE-23L
Kod Erasmus / ISCED: (brak danych) / (brak danych)
Nazwa przedmiotu: Micro and Nano Detection
Jednostka: Instytut Optoelektroniki
Grupy:
Punkty ECTS i inne: (brak) Podstawowe informacje o zasadach przyporządkowania punktów ECTS:
  • roczny wymiar godzinowy nakładu pracy studenta konieczny do osiągnięcia zakładanych efektów uczenia się dla danego etapu studiów wynosi 1500-1800 h, co odpowiada 60 ECTS;
  • tygodniowy wymiar godzinowy nakładu pracy studenta wynosi 45 h;
  • 1 punkt ECTS odpowiada 25-30 godzinom pracy studenta potrzebnej do osiągnięcia zakładanych efektów uczenia się;
  • tygodniowy nakład pracy studenta konieczny do osiągnięcia zakładanych efektów uczenia się pozwala uzyskać 1,5 ECTS;
  • nakład pracy potrzebny do zaliczenia przedmiotu, któremu przypisano 3 ECTS, stanowi 10% semestralnego obciążenia studenta.
Język prowadzenia: angielski
Forma studiów:

stacjonarne

Rodzaj studiów:

II stopnia

Rodzaj przedmiotu:

wybieralny

Forma zajęć liczba godzin/rygor:

(tylko po angielsku) lecture - 20 hrs

tutorial - 8 hrs

laboratories - 12 hrs

Przedmioty wprowadzające:

(tylko po angielsku) Physics,

Basics of Optics,

Electromagnetic Radiation.

Autor:

(tylko po angielsku) prof. Przemysław Wachulak

Bilans ECTS:

(tylko po angielsku) 3.0

Skrócony opis: (tylko po angielsku)

Tme Micro and Nano detection course will be devoted to imaging methods in the micro and nanometer scale. The methods of imaging in the visible range of electromagnetic radiation and in the short-wave range with the use of Xrays, as well as the use of electrons as an information carriers will be discussed for nanoimaging.

Pełny opis: (tylko po angielsku)

Tme Micro and Nano detection course will be devoted to imaging methods in the micro and nanometer scale. The methods of imaging in the visible range of electromagnetic radiation and in the short-wave range with the use of Xrays will be discussed. In addition, methods using electrons as information carriers, as well as methods using short-range interactions, such as tunneling or atomic microscopy, will be presented. The physical principles of operation of imaging systems, measurement methods along with examples of such commercial devices and the possibilities of imaging matter in the micro and nanometer scale will be discussed. More detailed topics: Optical microscopy, superresolution microscopic techniques. STED microscopy. Short wavelength radiation (extreme ultraviolet, soft X-ray and hard X-ray). Nanoholography: Gabor, Fourier. Computer generated nanoholograms. Talbot imaging. Coherent diffraction lensless imaging. Ptychography. Full field nanoimaging. Nanotomography. Contact microscopy. Electron microscopy: scanning and transmission. Scanning tunneling microscopy. Atomic force microscopy.

Literatura: (tylko po angielsku)

1. M. Born, E. Wolf , "Pronciples of Optics', Pergamon Press, any adition.

2. Randy Wayne, "Light and Video Microscopy", Elsevier, 2009

3. A. Michette, "OPTICAL SYSTEMS FOR SOFT X RAYS", PLENUM PRESS • NEW YORK AND LONDON, 1986

4. S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo, "Electron Microscopy Principles and Fundamentals"

Efekty uczenia się: (tylko po angielsku)

K_W04, K_W06, K_W07, K_W13, K_W15, K_W16, K_W17, K_U05,

K_U07, K_U08, K_U10, K_U11, K_U13, KK_01, K_K02, K_K03, K_K07

Students will learn principles of imaging in micro and nano scale, starting from the most basic imaging techniques and microscopes in the visible spectral range, superresolution methods, systems and devices operating in the short wavelength range (EUV and SXR radiation), through the imaging techniques employing electrons as information carriers , finally learning about atomic force microscopic techniques operating based on the van der Walls interactions between sample and the probe. The course is a good overview of the imaging techniques used currently in the laboratories and industry.

Metody i kryteria oceniania: (tylko po angielsku)

The learning outcomes achieved by the student in classes requiring a direct participation of academic staff and students are subject to verification in the framework of basic science classes, practical classes (including lectures, exercises, laboratory classes) as well as individual tasks and work performed by the student without the participation of the academic teacher (individual learning). The verification of the expected learning outcomes takes the form of examinations (written, test typically), credits for assessment, credits, activity of each student in the class , tests, participation and activity in the exercise classes. The assessment of the expected learning outcomes achieved by the student consists on the assessment by the academic staff of the student’s level of achievement of the expected learning outcomes.

The following levels of achievement of expected outcomes when assessing the student:

Very good grade is awarded to the student who has achieved the expected learning outcomes at the level of 91-100%.

Good plus grade is awarded to the student who has achieved the expected learning outcomes at the level of 81-90%. Good grade is awarded to the student who has achieved the expected learning outcomes at the level of 71-80%.

Sufficient plus grade is awarded to the student who has achieved the expected learning outcomes at the level of 61-70%. Sufficient grade is awarded to the student who has achieved the expected learning outcomes at the level of 51-60%.

Insufficient grade is awarded to the student who has achieved the expected learning outcomes at the level equal or lower than 50%.

General credited grade is awarded to the student who has achieved the expected learning outcomes at the level higher than 50%.

General non-credited grade is awarded to the student who has achieved the expected learning outcomes at the level equal or lower than 50%

Praktyki zawodowe: (tylko po angielsku)

N/A

Przedmiot nie jest oferowany w żadnym z aktualnych cykli dydaktycznych.
Opisy przedmiotów w USOS i USOSweb są chronione prawem autorskim.
Właścicielem praw autorskich jest Wojskowa Akademia Techniczna.
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